MEMBRANE SPECTROSCOPY

By V. KAZIS

CONTENTS XRF-BASICS INTRODUCTION INTERACTION OF X-RAYS WITH MATTER USED FOR MATERIAL CHARACTERIZATION ABSORPTION EMISSION OF FLUORESCENCE RADIATION REFRACTION SCATTERING DIFFRACTION GENERAL DESIGN OF X-RAY SPECTROMETERS REFERENCES MAIN COMPONENTS OF X-RAY SPECTROMETERS EXCITATION SOURCE EXCITATION BY ELECTRONS EXCITATION BY PHOTONS X-RAY TUBES CONCLUSIONS FOR EXCITATION IN L-XRF PRIMARY OPTICS BASIC PROPERTIES OF X-RAY OPTICS DIFFRACTION OPTICS REFRACTION OPTICS REFLECTION ZONE PLATES OPTICS BASED ON TOTAL REFLECTION COMPARISON OF DIFFERENT OPTICS FOR THEIR USE IN L-XRF SAMPLE POSITIONING AND RADIATION SHIELDING SPECIAL REQUIREMENTS FOR SAMPLE POSITIONINGIN L-XRF IMAGE VIEW SPATIAL RESOLUTION MEASUREMENT MEDIA SECONDARY OPTICS: SPECTROMETER TYPE WAVELENGTH DISPERSIVE SPECTROMETERS ENERGY DISPERSIVE SPECTROMETERS X-RAY DETECTORS WORKING PRINCIPLES AND DETECTOR TYPES GENERATION OF AN ENERGY DISPERSIVE SPECTRUM ENERGY RESOLUTION DETECTION EFFICIENCY DEVELOPMENT OF ENERGY DISPERSIVE X-RAY DETECTORS DETECTOR ARTIFACTS SPECIAL REQUIREMENTS FOR L-XRF HISTORY OF POSITION SENSITIVE ELEMENT ANALYSIS POSSIBILITIES FOR SPATIAL RESOLVED XRF EXCITATION OF A SMALL SAMPLE AREA EXCITATION OF A LARGE SAMPLE AREA CONFOCAL GEOMETRY INSTRUMENT TYPES SPOT GENERATION EXCITATION DIRECTION DETECTOR TYPES MEASUREMENT MEDIUM SAMPLE MOVEMENT TYPE OF THE SPECTROMETER INSTRUMENTS ON THE MARKET TYPICAL MEASUREMENT MODES FOR L-XRF SINGLE POINT MEASUREMENT MUTIPLE POINT MEASUREMENT AREA ANALYSIS LINESCAN MAPPING QUANTI?CATION DIFFERENT TYPES OF QUANTIFICATION QUALITATIVE AND SEMI-QUANTITATIVE METHODS QUANTIFICATION METHODS QUANTIFICATION FOR L-XRF SPECIAL CONDITIONS QUANTIFICATION WITH THE FUNDAMENTAL PARAMETER MODEL SUMMARY ANALYSIS OF COATING SYSTEMS PRINCIPLE OF COATING ANALYSIS REQUIREMENTS FOR COATING ANALYSIS GENERAL EQUATIONS FOR COATING THICKNESS TESTING THICKNESS RANGES FOR THE COATING MEASUREMENTS MULTIPLE LAYER ANALYSIS ACCURACY FOR COATING ANALYSIS ERRORS IN L-XRF CHARACTERIZATION OF ERRORS RANDOM ERROR CONTRIBUTIONS SYSTEMATIC ERROR CONTRIBUTIONS CONCEPT OF UNCERTAINTY POSSIBILITIES FOR IMPROVEMENT OF ACCURACY SAMPLE PREPARATION INFORMATION DEPTH PREPARATION AND PRESENTATION OF DIFFERENT SAMPLE QUALITIES SOLID SAMPLES POWDER SAMPLES FILTER MATERIALS LIQUID SAMPLES ARCHEOLOGICAL SAMPLES RELATIONS TO OTHER ANALYTICAL METHODS COMPARISON WITH OTHER MICRO-ANALYTICAL METHODS OVERVIEW SYNCHROTRON EXCITED L-XRF SEM-EDS COMBINATION OF L-XRF WITH OTHER METHODS GENERAL REMARKS SEM-EDS AND L-XRF L-XRF AND L-XRD RAMAN SPECTROSCOPY AND L-XRF APPLICATIONS POINT ANALYSIS ANALYSIS OF PRECIOUS METAL ALLOYS COATING THICKNESS ANALYSIS ANALYSIS OF PARTICLES AND INCLUSIONS ANALYSIS OF RESTRICTED ELEMENTS IN CONSUMER GOODS MULTIPLE POINT ANALYSIS MULITI-POINT MEASUREMENTS HIGH THROUGHPUT SCREENING ONE DIMENSIONAL DISTRIBUTION ANALYSIS: LINESCAN DETERMINATION OF DIFFUSION PROFILES ANALYSIS OF GEMS EXAMINATION OF ROLL BEARINGS ANALYSIS OF SEDIMENT BORE CORES TWO DIMENSIONAL DISTRIBUTION ANALYSIS: MAPPING ANALYSIS OF GEOLOGICAL SAMPLES EXAMINATION OF ART OBJECTS LIFE SCIENCE APPLICATIONS ELECTRONICS MATERIAL ANALYSIS FORENSIC APPLICATIONS THREE DIMENSIONAL DISTRIBUTION ANALYSIS DESTRUCTIVE 3D-ANALYSIS MEASUREMENTS WITH CONFOCAL GEOMETRY PROSPECTIVES FOR L-XRF INSTRUMENTATION INSTRUMENT CONTROL AND DATA EVALUATION REFERENCE FURTHER READINGS