INTRODUCTION TO RADIOANALYTICAL PHYSICS
CONTENTS EMISSION (PIXE) INTRODUCTION PRINCIPLE OF XRF AND PIXE TECHNIQUES THEORY AND CONCEPT SPECTRAL SERIES, THE MOSELEY LAW LINE INTENSITIES AND FLUORESCENCE YIELD CRITICAL EXCITATION ENERGIES OF THE EXCITING RADIATION/PARTICLES INSTRUMENTATION/EXPERIMENTATION MODES OF EXCITATION FOR XRF ANALYSIS X-RAY DETECTION AND ANALYSIS IN XRF SOURCE OF EXCITATION AND X-RAY DETECTION IN PIXE ANALYSIS SOME OTHER ASPECTS CONNECTED WITH PIXE ANALYSIS QUALITATIVE AND QUANTITATIVE ANALYSIS THICK VS THIN SAMPLES FORMALISM FOR THIN-TARGET XRF FORMALISM FOR THICK-TARGET XRF FORMALISM FOR THIN-TARGET PIXE FORMALISM FOR THICK-TARGET PIXE COUNTING STATISTICS AND MINIMUM DETECTION LIMIT SOURCES OF BACKGROUND CONTRIBUTION OF EXCITER SOURCE TO SIGNAL BACKGROUND CONTRIBUTION OF SCATTERING GEOMETRY TO SIGNAL BACKGROUND CONTRIBUTION OF DETECTION SYSTEM TO SIGNAL BACKGROUND METHODS FOR IMPROVING DETECTION LIMITS 110 COMPUTER ANALYSIS OF X-RAY SPECTRA 111 SOME OTHER TOPICS RELATED TO PIXE ANALYSIS 1111 DEPTH PRO?LING OF MATERIALS BY PIXE 1112 PROTON MICROPROBES 1113 THEORIES OF X-RAY EMISSION BY CHARGED PARTICLES 112 APPLICATIONS OF XRF AND PIXE TECHNIQUES 1121 IN BIOLOGICAL SCIENCES 1122 IN CRIMINOLOGY 1123 IN MATERIAL SCIENCE 1124 POLLUTION ANALYSIS 1125 FOR ARCHAEOLOGICAL SAMPLES 1126 FOR CHEMICAL ANALYSIS OF SAMPLES 1127 FOR ANALYSIS OF MINERAL SAMPLES 113 COMPARISON BETWEEN EDXRF AND WDXRF TECHNIQUES 1131 RESOLUTION 1132 SIMULTANEITY 1133 SPECTRAL OVERLAPS 1134 BACKGROUND 1135 EXCITATION E?CIENCY 114 COMPARISON BETWEEN XRF AND PIXE TECHNIQUES 115 CONCLUSION RUTHERFORD BACKSCATTERING SPECTROSCOPY SCATTERING FUNDAMENTALS IMPACT PARAMETER, SCATTERING ANGLE, AND DISTANCE OF CLOSEST APPROACH KINEMATIC FACTOR STOPPING POWER, ENERGY LOSS, RANGE, AND STRAGGLING ENERGY OF PARTICLES BACKSCATTERED FROM THIN AND THICK TARGETS STOPPING CROSS-SECTION RUTHERFORD SCATTERING CROSS-SECTION PRINCIPLE OF RUTHERFORD BACKSCATTERING SPECTROSCOPY FUNDAMENTALS OF THE RBS TECHNIQUE AND ITS CHARACTERISTICS DEVIATIONS FROM RUTHERFORD FORMULA NON-RUTHERFORD CROSS-SECTIONS SHIELDED RUTHERFORD CROSS-SECTIONS INSTRUMENTATION/EXPERIMENTAL ACCELERATOR, BEAM TRANSPORT SYSTEM, AND SCATTERING CHAMBER PARTICLE DETECTORS RBS SPECTRA FROM THIN AND THICK LAYERS RBS SPECTRUM FROM A THIN LAYERS RBS SPECTRUM FROM THICK LAYERS SPECTRUM ANALYSIS/SIMULATION HEAVY ION BACKSCATTERING SPECTROMETRY 210 HIGH-RESOLUTION RBS 211 MEDIUM ENERGY ION SCATTERING 212 CHANNELING 213 RUTHERFORD SCATTERING USING FORWARD ANGLES 214 APPLICATIONS OF RBS 215 LIMITATION OF THE RBS TECHNIQUE ELASTIC RECOIL DETECTION FUNDAMENTALS OF THE ERDA TECHNIQUE SCATTERING CROSS-SECTIONS AND DEPTH RESOLUTION IN ERD STOPPING POWER AND STRAGGLING PRINCIPLE AND CHARACTERISTICS OF ERDA EXPERIMENTAL ERDA USING E-DETECTION (CONVENTIONAL SET-UP) ERDA WITH PARTICLE IDENTI?CATION AND DEPTH RESOLUTION HEAVY ION ERDA DATA ANALYSIS ADVANTAGES AND LIMITATIONS OF ERDA M¨OSSBAUER SPECTROSCOPY (MS) CONCEPT AND THEORY NUCLEAR RESONANCE FLUORESCENCE NUCLEAR PHYSICS OF 57FE LAMB–M¨OSSBAUER FACTOR (RECOIL-FREE FRACTION) SOME OTHER M¨OSSBAUER ISOTOPES AND THEIR ?-TRANSITIONS CHARACTERISTIC PARAMETERS OBTAINABLE THROUGH M¨OSSBAUER SPECTROSCOPY EXPERIMENTAL SET-UP A BASIC M¨OSSBAUER SPECTROMETER SET-UP ADVANCES IN EXPERIMENTAL SET-UP/METHOD OF ANALYSIS EVALUATION OF M¨OSSBAUER SPECTRA CONVERSION ELECTRON M¨OSSBAUER SPECTROSCOPY APPLICATIONS CHEMICAL ANALYSIS NONDESTRUCTIVE TESTING AND SURFACE STUDIES INVESTIGATION OF NEW MATERIALS FOR INDUSTRIAL APPLICATIONS CHARACTERIZATION OF NANOSTRUCTURED MATERIALS TESTING OF REACTOR STEEL IN MARS EXPLORATION STUDY OF ACTINIDES STUDY OF BIOLOGICAL MATERIALS INVESTIGATION OF LATTICE DYNAMICS USING THE RAYLEIGH SCATTERING OF M¨OSSBAUER ?-RAYS X-RAY PHOTOELECTRON SPECTROSCOPY PRINCIPLE AND CHARACTERISTICS OF XPS COMMONLY USED X-RAY SOURCES FOR XPS ANALYSIS PHOTOELECTRON ANALYZERS/DETECTORS EXPERIMENTAL WORKSTATION DATA ACQUISITION AND ANALYSIS PRINCIPLE PHOTOELECTRON LINES FOR A FEW ELEMENTS SALIENT FEATURES OF XPS AND A FEW PRACTICAL EXAMPLES APPLICATIONS OF XPS MICROANALYSIS OF THE SURFACES OF METALS AND ALLOYS STUDY OF MINERAL SURFACES STUDY OF POLYMERS STUDY OF MATERIAL USED FOR MEDICAL PURPOSE FOR SURFACE CHARACTERIZATION OF COAL ASH SURFACE STUDY OF CEMENTS AND CONCRETES STUDY OF HIGH ENERGY RESOLUTION SOFT X-RAYS CORE LEVEL PHOTOEMISSION IN THE STUDY OF BASIC ATOMIC PHYSICS ADVANTAGES AND LIMITATIONS OF XPS NEUTRON ACTIVATION ANALYSIS PRINCIPLE PROMPT VS DELAYED NAA EPITHERMAL AND FAST NEUTRON ACTIVATION ANALYSIS NEUTRON SOURCES A FEW RADIOISOTOPES FORMED THROUGH (N, ?) REACTION (USED FOR ELEMENTAL IDENTI?CATION) AND THEIR HALF-LIVES SCINTILLATION AND SEMICONDUCTOR ?-RAY DETECTORS ?-RAY SPECTROMETER QUANTITATIVE ANALYSIS USING NAA ABSOLUTE METHOD FOR A SINGLE ELEMENT COMPARISON METHOD SIMULATION: MCNP CODE SENSITIVITIES AVAILABLE BY NAA APPLICATIONS OF NAA IN ARCHAEOLOGY IN BIOCHEMISTRY IN ECOLOGICAL MONITORING OF ENVIRONMENT IN MICROANALYSIS OF BIOLOGICAL MATERIALS IN FORENSIC INVESTIGATIONS IN GEOLOGICAL SCIENCE IN MATERIAL SCIENCE (DETECTION OF COMPONENTS OF METALS, SEMICONDUCTORS, AND ALLOYS) IN SOIL SCIENCE, AGRICULTURE, AND BUILDING MATERIALS FOR ANALYSIS OF FOOD ITEMS AND AYURVEDIC MEDICINAL MATERIALS 6610 DETECTION OF EXPLOSIVES, FISSILE MATERIALS, AND DRUGS ADVANTAGES AND LIMITATIONS OF NAA ADVANTAGES OF NAA LIMITATIONS OF NAA NUCLEAR REACTION ANALYSIS AND PARTICLE-INDUCED GAMMA-RAY EMISSION PRINCIPLE OF NRA REACTION KINEMATICS FOR NRA EXAMPLES OF SOME IMPORTANT REACTIONS PARTICLE-INDUCED ?-EMISSION ANALYSIS EXPERIMENTAL METHODS DETECTION LIMIT/SENSITIVITY APPLICATIONS OF NRA FOR MATERIAL ANALYSIS FOR DEPTH PRO?LING STUDIES FOR TRACER STUDIES AND FOR THE STUDY OF MEDICAL SAMPLES FOR THE STUDY OF ARCHAEOLOGICAL SAMPLES APPLICATIONS OF PIGE FOR THE STUDY OF MEDICAL SAMPLES FOR THE STUDY OF ARCHAEOLOGICAL SAMPLE FOR THE STUDY OF AEROSOL SAMPLES FOR THE STUDY OF SOIL, CONCRETE, ROCKS, AND GEOCHEMICAL SAMPLES COMMON PARTICLE–PARTICLE NUCLEAR REACTIONS PROTON-INDUCED REACTIONS DEUTERON-INDUCED REACTIONS 3HE-, 4HE-INDUCED REACTIONS SOME IMPORTANT REACTIONS USED FOR NRA ANALYSIS SOME IMPORTANT REACTIONS USED FOR PIGE ANALYSIS ACCELERATOR MASS SPECTROMETRY (AMS) AMS USING LOW-ENERGY ACCELERATORS SAMPLE PREPARATION FOR AMS TIME-OF-FLIGHT MASS SPECTROMETRY (TOF-MS) DETECTION LIMITS OF PARTICLES ANALYZED BY AMS APPLICATIONS OF AMS IN THE FIELD OF ARCHEOLOGY IN THE FIELD OF EARTH SCIENCE FOR STUDY OF POLLUTION IN THE FIELD OF BIOMEDICINE IN THE FIELD OF HYDROLOGY IN MATERIAL ANALYSIS IN THE FIELD OF FOOD CHEMISTRY FOR STUDY OF NUTRIENTS IN THE FIELD OF GEOLOGICAL SCIENCE 8810 FOR STUDY OF ICE-CORES USE OF VARIOUS ISOTOPES FOR IMPORTANT AMS STUDIES USE OF 10BE USE OF 14C USE OF 26AL USE OF 36CL USE OF 41CA USE OF 59NI 810 AMS OF MOLECULAR IONS 811 ADVANTAGES AND LIMITATIONS OF AMS