THEORETICAL BASIS OF CONFOCAL MICROSCOPY
CONTENTS 1 AN INTRODUCTION TO MICROSCOPY LIMITATIONS OF THE HUMAN EYE THE LIGHT-OPTICAL MICROSCOPE THE X-RAY MICROSCOPE THE TRANSMISSION ELECTRON MICROSCOPE THE SCANNING ELECTRON MICROSCOPE SCANNING TRANSMISSION ELECTRON MICROSCOPE ANALYTICAL ELECTRON MICROSCOPY SCANNING-PROBE MICROSCOPES 2 ELECTRON OPTICS PROPERTIES OF AN IDEAL IMAGE IMAGING IN LIGHT OPTICS IMAGING WITH ELECTRONS FOCUSING PROPERTIES OF A THIN MAGNETIC LENS COMPARISON OF MAGNETIC AND ELECTROSTATIC LENSES DEFECTS OF ELECTRON LENSES 3 THE TRANSMISSION ELECTRON MICROSCOPE THE ELECTRON GUN ELECTRON ACCELERATION CONDENSER-LENS SYSTEM THE SPECIMEN STAGE TEM IMAGING SYSTEM VACUUM SYSTEM 4 TEM SPECIMENS AND IMAGES KINEMATICS OF SCATTERING BY AN ATOMIC NUCLEUS ELECTRON-ELECTRON SCATTERING THE DYNAMICS OF SCATTERING SCATTERING CONTRAST FROM AMORPHOUS SPECIMENS DIFFRACTION CONTRAST FROM POLYCRYSTALLINE SPECIMENS DARK-FIELD IMAGES ELECTRON-DIFFRACTION PATTERNS DIFFRACTION CONTRAST WITHIN A SINGLE CRYSTAL PHASE CONTRAST IN THE TEM 4 10 TEM SPECIMEN PREPARATION 5 THE SCANNING ELECTRON MICROSCOPE OPERATING PRINCIPLE OF THE SEM PENETRATION OF ELECTRONS INTO A SOLID SECONDARY-ELECTRON IMAGES BACKSCATTERED-ELECTRON IMAGES OTHER SEM IMAGING MODES SEM OPERATING CONDITIONS SEM SPECIMEN PREPARATION THE ENVIRONMENTAL SEM ELECTRON-BEAM LITHOGRAPHY 6 ANALYTICAL ELECTRON MICROSCOPY THE BOHR MODEL OF THE ATOM X-RAY EMISSION SPECTROSCOPY X-RAY ENERGY-DISPERSIVE SPECTROSCOPY QUANTITATIVE ANALYSIS IN THE TEM QUANTITATIVE ANALYSIS IN THE SEM X-RAY WAVELENGTH-DISPERSIVE SPECTROSCOPY COMPARISON OF XEDS AND XWDS ANALYSIS AUGER ELECTRON SPECTROSCOPY ELECTRON ENERGY-LOSS SPECTROSCOPY 7 RECENT DEVELOPMENTS SCANNING TRANSMISSION ELECTRON MICROSCOPY ABERRATION CORRECTION ELECTRON-BEAM MONOCHROMATORS ELECTRON HOLOGRAPHY TIME-RESOLVED MICROSCOPY